RESONANCE DIFFRACTION EFFICIENCY ENHANCEMENT IN SLICED MULTILAYERS

被引:16
作者
LEVASHOV, VE
VINOGRADOV, AV
机构
[1] P. N. Lebedev Physical Institute, Academy of Sciences of Russia, Moscow, 117924
来源
APPLIED OPTICS | 1993年 / 32卷 / 07期
关键词
D O I
10.1364/AO.32.001130
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The theory of transmission and reflection sliced multilayers is considered. The possible scheme of a high throughput and resolution spectrograph for the 124-250-angstrom range is proposed.
引用
收藏
页码:1130 / 1135
页数:6
相关论文
共 8 条
[1]   MEASUREMENTS OF THE NORMAL-INCIDENCE X-RAY REFLECTANCE OF A MOLYBDENUM-SILICON MULTILAYER DEPOSITED ON A 20001/MM GRATING [J].
CRUDDACE, RG ;
BARBEE, TW ;
RIFE, JC ;
HUNTER, WR .
PHYSICA SCRIPTA, 1990, 41 (04) :396-399
[2]  
Fedorenko A., COMMUNICATION
[3]  
KONDRATENKO VV, 1990, P INT C XRAY LASERS
[4]   BASIC FORMULAS OF XUV MULTILAYER OPTICS [J].
KOZHEVNIKOV, IV ;
VINOGRADOV, AV .
PHYSICA SCRIPTA, 1987, T17 :137-145
[5]  
MICHETTE AG, 1984, XRAY MICROSCOPY, V43, P109
[6]  
PIJK EJ, 1990, MULTILAYER XRAY COAT
[7]  
RAGOZIN EN, 1987, 304 PN LEB PHYS I PR
[8]   PERFORMANCE OF A TUNGSTEN CARBON MULTILAYER-COATED, BLAZED GRATING FROM 150 TO 1700 EV [J].
RIFE, JC ;
BARBEE, TW ;
HUNTER, WR ;
CRUDDACE, RG .
PHYSICA SCRIPTA, 1990, 41 (04) :418-421