THE RESIN BEAD AS A THERMAL ION-SOURCE - A SIMS STUDY

被引:35
作者
SMITH, DH
CHRISTIE, WH
EBY, RE
机构
来源
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1980年 / 36卷 / 03期
关键词
D O I
10.1016/0020-7381(80)85064-9
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
引用
收藏
页码:301 / 316
页数:16
相关论文
共 22 条
[1]   ION MICROPROBE MASS ANALYZER [J].
ANDERSEN, CA ;
HINTHORNE, JR .
SCIENCE, 1972, 175 (4024) :853-+
[2]  
Bernheim M., 1973, International Journal of Mass Spectrometry and Ion Physics, V12, P93, DOI 10.1016/0020-7381(73)80090-7
[3]  
CARTER JA, 1973, SAFEGUARDING NUCLEAR, V2, P461
[4]  
DALY NR, 1960, REV SCI INSTRUM, V312, P64
[5]  
FREEMAN DH, 1970, ANAL CHEM, V42, P203
[6]   THE BEHAVIOR OF RHENIUM IN ELECTRON TUBE ENVIRONMENTS [J].
GAINES, GB ;
SIMS, CT ;
JAFFEE, RI .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1959, 106 (10) :881-885
[7]   SURFACE IONIZATION .2. FIRST IONIZATION POTENTIAL OF URANIUM [J].
HERTEL, GR .
JOURNAL OF CHEMICAL PHYSICS, 1967, 47 (01) :335-&
[8]  
LANGMUIR I, 1952, P R SOC LONDON, V107, P61
[9]   ION MICROPROBE MASS ANALYZER [J].
LIEBL, H .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (13) :5277-&
[10]  
McHugh J., 1969, INT J MASS SPECTROM, V3, P267