RADIOCARBON ACCELERATOR MASS-SPECTROMETRY - BACKGROUND AND CONTAMINATION

被引：22

作者：

BEUKENS, RP

机构：

[1] IsoTrace Laboratory, University of Toronto, Toronto

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1993年 / 79卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(93)95427-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Since the advent of radiocarbon accelerator mass spectrometry (AMS) many studies have been conducted to understand the background from mass spectrometric processes and the origins of contamination associated with the ion source and sample preparation. By studying the individual contributions a better understanding of these processes has been obtained and it has been demonstrated that it is possible to date samples reliably up to 60000 BP.

引用

页码：620 / 623

页数：4

共 7 条

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BEUKENS, RP ;

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[2] PROGRESS AT THE ISOTRACE RADIOCARBON FACILITY [J].

BEUKENS, RP ;

GURFINKEL, DM ;

LEE, HW .

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[3]

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[4]

BEUKENS RP, 1980, AECL TR39 REP

[5]

BEUKENS RP, 1988, 2ND P INT C ACC MASS, P416

[6] ENERGY-DISTRIBUTION OF NEGATIVE-IONS SPUTTERED FROM CESIATED SURFACES [J].

DOUCAS, G .

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1977, 25 (01) :71-87

[7]

LEE HW, 1990, THESIS U TORONTO

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