THICKNESS DEPENDENCE OF THE TWIN DENSITY IN YBA2CU3O7-DELTA THIN-FILMS SPUTTERED ONTO MGO SUBSTRATES

被引：44

作者：

STREIFFER, SK

ZIELINSKI, EM

LAIRSON, BM

BRAVMAN, JC

机构：

[1] Department of Materials Science and Engineering, Stanford University, Stanford

来源：

APPLIED PHYSICS LETTERS | 1991年 / 58卷 / 19期

关键词：

D O I：

10.1063/1.104996

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The lengths and spacings of twins in YBa2Cu3O7-delta thin films deposited onto MgO substrates have been measured by transmission electron microscopy as a function of film thickness t, for t ranging from 50 to 1400 nm. The twin length is linear in t, while the twin spacing follows a t1/2 dependence. This form for the twin spacing is consistent with the prediction of a simple free energy expression for the twinning transformation.

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页码：2171 / 2173

页数：3

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