ABSOLUTE TESTING OF FLATNESS STANDARDS AT SQUARE-GRID POINTS

被引:41
作者
GRZANNA, J
SCHULZ, G
机构
[1] Zentralinstitut für Optik und Spektroskopie der AdW der DDR, 1199 Berlin, DDR
关键词
D O I
10.1016/0030-4018(90)90417-R
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
For the absolute interferometric testing of three unknown plane surfaces A, B, C, the surfaces can be combined in pairs in different positions. For such positional combinations a new rotation shift method is described. In addition to the three basic positions AB, BC, CA, this method uses one or two further positions that are reached by a 90° rotation and a parallel shift of one surface from the respective basic position. This makes it possible to determine the absolute flatness deviations of the three surfaces at the modes Qij of a square grid whose grid spacing is equal to the shifting distance. In comparison with known methods, this has the advantage that, if image detectors of a square grid structure are used, it does not require any interpolations between the detector elements and the points Qij. The basic equations and a method for their error-adjusted solution are stated. The solution is shown to be unique. © 1990.
引用
收藏
页码:107 / 112
页数:6
相关论文
共 7 条
[1]  
BIRCH KG, 1973, NPL MOM5 REP
[2]   MEASUREMENT OF OPTICAL FLATNESS [J].
DEW, GD .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1966, 43 (07) :409-&
[3]  
FRITZ BS, 1987, OPT ENG, V23, P379
[4]  
GRZANNA J, 1988, BEITR OPTIK QUANTENE, V13, P93
[5]  
SCHULZ BG, 1967, OPT ACTA, V14, P375
[6]  
SCHULZ G, 1976, PROGR OPTICS, V13, pCH4
[7]  
SCHWIDER J, 1967, OPT ACTA, V14, P389