DETERMINATION OF DOMAIN WALL PROFILES IN MAGNETIC FILMS

被引：9

作者：

HARTE, KJ

COHEN, MS

机构：

[1] Lincoln Laboratory, Massachusetts Institute of Technology, Lexington

来源：

JOURNAL OF APPLIED PHYSICS | 1969年 / 40卷 / 03期

关键词：

D O I：

10.1063/1.1657597

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

To determine the domain wall profile in a magnetic film from a defocused Lorentz micrograph, the electron intensity g(x) (which is inferred from the micrograph) must be translated into a curve of φ(ξ), where φ is the angle between the magnetization M and the wall normal and ξ is the position in the film plane measured from the wall center. To accomplish this task, classical and semiclassical inversion" procedures which yield φ(ξ) from g(x) are presented. The validity of this approach is demonstrated by computer calculations on an artificial wall. An example of the inversion procedure applied to experimental data is given. © 1969 The American Institute of Physics."

引用

页码：1218 / &