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A prognostic approach for non-punch through and field stop IGBTs.[J].Nishad Patil;Diganta Das;Michael Pecht.Microelectronics Reliability.2011, 3
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LabVIEW数据采集与仪器控制.[M].龙华伟;伍俊;顾永刚;冯涛.清华大学出版社.2016,
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随机模拟方法与应用.[M].肖柳青;周石鹏.北京大学出版社.2014,
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加速寿命试验技术与应用.[M].陈循; 张春华; 汪亚顺; 谭源源; 著.国防工业出版社.2013,
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IGBT和IPM及其应用电路.[M].周志敏;周纪海;纪爱华编著;.人民邮电出版社.2006,
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