SEMICONDUCTOR DETECTORS FOR CHARGED-PARTICLE SPECTROSCOPY IN 80 MEV RANGE

被引：22

作者：

RIEPE, G

PROTIC, D

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS | 1972年 / 101卷 / 01期

关键词：

D O I：

10.1016/0029-554X(72)90760-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：77 / +

页数：1

共 12 条

[1]

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[4] DETECTION OF 160 MEV PROTONS BY A LITHIUM-DRIFTED GERMANIUM COUNTER IN A SIDE-ENTRY ORIENTATION [J].

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[5] GERMANIUM TOTAL ABSORPTION SPECTROMETER FOR 100-MEV PROTON SCATTERING [J].

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[6]

KRANER HW, 1969, SEMICONDUCTOR NUCLEA, P339

[7]

KUHN A, 1969, HALBLEITER KRISTALLZ

[8] USE OF GERMANIUM DETECTORS FOR CHARGED PARTICLES [J].

MARCUS, L ;

DUHAMEL, G ;

LANGEVIN.H .

REVUE DE PHYSIQUE APPLIQUEE, 1969, 4 (02) :279-+

[9]

PEHL RH, 1969, NUCL INSTR, V65, P175

[10] DEAD LAYERS ON SEMICONDUCTOR DETECTORS FOR CHARGED-PARTICLE SPECTROSCOPY [J].

PROTIC, D ;

RIEPE, G .

NUCLEAR INSTRUMENTS & METHODS, 1972, 101 (01) :55-+

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