The measurement of x-ray intensities as functions of voltage, up to 180 kv

被引:8
作者
Webster, DL [1 ]
Hansen, WW [1 ]
Duveneck, FB [1 ]
机构
[1] Stanford Univ, Stanford, CA USA
关键词
D O I
10.1063/1.1748889
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:729 / 749
页数:21
相关论文
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