MEASUREMENT OF DENSITIES OF THIN AMORPHOUS FILMS PREPARED BY VACUUM-EVAPORATION

被引：7

作者：

SHIOJIRI, M ^{[1
]}

SAITO, Y ^{[1
]}

OKADA, H ^{[1
]}

机构：

[1] KYOTO TECH UNIV,DEPT PHYS,SAKYO KU,KYOTO 606,JAPAN

来源：

关键词：

D O I：

10.1143/JJAP.16.1481

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1481 / 1482

页数：2

共 16 条

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[4] OPTICAL PROPERTIES OF AMORPHOUS GERMANIUM FILMS
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[6] THIN FILM DENSITIES
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[7] DENSITY OF THIN EVAPORATED ALUMINUM FILMS
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[8] PREPARATION, STRUCTURE, AND APPLICATIONS OF THIN FILMS OF SILICON MONOXIDE AND TITANIUM DIOXIDE
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[J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1950, 33 (12) : 353 - 360
[9] ELECTRON DIFFRACTION STUDY OF EVAPORATED CARBON FILMS
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[J]. ACTA CRYSTALLOGRAPHICA, 1960, 13 (03): : 171 - 179
[10] MALE D, 1954, ANN PHYS-PARIS, V9, P10