APPROXIMATE STRAIN COEFFICIENTS OF METALLIC-FILMS DEDUCED FROM AN EFFECTIVE FUCHS-SONDHEIMER CONDUCTION MODEL AND FROM AN EFFECTIVE RELAXATION-TIME METHOD

被引：11

作者：

TELLIER, CR

TOSSER, AJ

机构：

[1] Laboratoire d'Electronique, Université de Nancy 1, 54037 Nancy Cédex

来源：

THIN SOLID FILMS | 1979年 / 57卷 / 01期

关键词：

D O I：

10.1016/0040-6090(79)90423-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Starting from two approximate conduction models (the effective Fuchs-Sondheimer model and the relaxation time model) analytical expressions for the strain coefficients of resistivity for polycrystalline films were calculated. A comparison of the exact expression previously derived with the approximate values shows that the effective Fuchs-Sondheimer method and the relaxation time method give adequate descriptions of the polycrystalline film resistivity and gauge factors. © 1979.

引用

页码：163 / 168

页数：6

共 11 条

[1] VALIDITY OF APPROXIMATE EQUATIONS FOR CALCULATION OF ELECTRON MEAN FREE PATH IN TERMS OF SIZE EFFECT THEORY [J].