ELLIPSOMETRY OF CLEAN SURFACES, SUBMONOLAYER AND MONOLAYER FILMS

[1] ADAMSON AW, 1976, PHYSICAL CHEM SURFAC, pCH2

[2] ELLIPSOMETRIC STUDY OF EFFECT OF ARGON ION-BOMBARDMENT ON STRUCTURE AND REACTIVITY OF AG(III) [J]. SURFACE SCIENCE, 1977, 64 (01) : 1 - 22

[3] ELLIPSOMETRY LEED STUDY OF OXYGEN-ADSORPTION AND CARBON MONOXIDE-OXYGEN INTERACTION ON AG(110) [J]. SURFACE SCIENCE, 1978, 77 (01) : 1 - 13

[4] STRUCTURE OF THE AG(110) SURFACE DETERMINED BY USING AVERAGED LEED INTENSITIES [J]. SURFACE SCIENCE, 1979, 80 (01) : 24 - 31

[5] MEASUREMENT OF OXYGEN ADSORPTION ON SILICON BYELLIPSOMETRY [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1965, 26 (02) : 343 - &

[6] ELLIPSOMETRY AND THEORY OF PHOTON SCATTERING FROM SURFACES [J]. SURFACE SCIENCE, 1970, 22 (02) : 433 - &

[7] ATKINS PW, 1973, SOLID STATE SURFACE, V2, P153

[8] AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ, P357

[9] OPTICAL-PROPERTIES OF ADSORBATE ATOMS [J]. PHYSICAL REVIEW B, 1975, 11 (10): : 3644 - 3657

[10] BOKX PKD, APPL SURFACE SCI

[1] ADAMSON AW, 1976, PHYSICAL CHEM SURFAC, pCH2

[2] ELLIPSOMETRIC STUDY OF EFFECT OF ARGON ION-BOMBARDMENT ON STRUCTURE AND REACTIVITY OF AG(III) [J]. SURFACE SCIENCE, 1977, 64 (01) : 1 - 22

[3] ELLIPSOMETRY LEED STUDY OF OXYGEN-ADSORPTION AND CARBON MONOXIDE-OXYGEN INTERACTION ON AG(110) [J]. SURFACE SCIENCE, 1978, 77 (01) : 1 - 13

[4] STRUCTURE OF THE AG(110) SURFACE DETERMINED BY USING AVERAGED LEED INTENSITIES [J]. SURFACE SCIENCE, 1979, 80 (01) : 24 - 31

[5] MEASUREMENT OF OXYGEN ADSORPTION ON SILICON BYELLIPSOMETRY [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1965, 26 (02) : 343 - &

[6] ELLIPSOMETRY AND THEORY OF PHOTON SCATTERING FROM SURFACES [J]. SURFACE SCIENCE, 1970, 22 (02) : 433 - &

[7] ATKINS PW, 1973, SOLID STATE SURFACE, V2, P153

[8] AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ, P357

[9] OPTICAL-PROPERTIES OF ADSORBATE ATOMS [J]. PHYSICAL REVIEW B, 1975, 11 (10): : 3644 - 3657

[10] BOKX PKD, APPL SURFACE SCI