MEASUREMENT OF OXYGEN ADSORPTION ON SILICON BYELLIPSOMETRY

[1] WORK FUNCTION AND EMISSION STUDIES ON CLEAN SILICON SURFACES [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1959, 8 : 119 - &

[2] Archer R. J., 1964, ELLIPSOMETRY MEASURE, P255

[3] DETERMINATION OF PROPERTIES OF FILMS ON SILICON BY METHOD OF ELLIPSOMETRY [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1962, 52 (09) : 970 - &

[4] OPTICAL CONSTANTS OF GERMANIUM - 3600-A TO 7000-A [J]. PHYSICAL REVIEW, 1958, 110 (02): : 354 - 358

[5] BORN M, 1933, OPTIK, V36

[6] BOWDEN FP, 1951, P ROY SOC LONDON, VA209, P297

[7] DETTORE JF, 1964, ELLIPSOMETRY MEASURE, P245

[8] DRUDE P, 1889, WIED ANN, V36, P865

[9] DRUDE P, 1890, WIED ANN, V39, P481

[10] DRUDE P, 1889, WIED ANN, V36, P532

[1] WORK FUNCTION AND EMISSION STUDIES ON CLEAN SILICON SURFACES [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1959, 8 : 119 - &

[2] Archer R. J., 1964, ELLIPSOMETRY MEASURE, P255

[3] DETERMINATION OF PROPERTIES OF FILMS ON SILICON BY METHOD OF ELLIPSOMETRY [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1962, 52 (09) : 970 - &

[4] OPTICAL CONSTANTS OF GERMANIUM - 3600-A TO 7000-A [J]. PHYSICAL REVIEW, 1958, 110 (02): : 354 - 358

[5] BORN M, 1933, OPTIK, V36

[6] BOWDEN FP, 1951, P ROY SOC LONDON, VA209, P297

[7] DETTORE JF, 1964, ELLIPSOMETRY MEASURE, P245

[8] DRUDE P, 1889, WIED ANN, V36, P865

[9] DRUDE P, 1890, WIED ANN, V39, P481

[10] DRUDE P, 1889, WIED ANN, V36, P532