HIGH-TEMPERATURE OPERATION OF STRAINED SI0.65GE0.35/SI(111) P-TYPE MULTIPLE-QUANTUM-WELL LIGHT-EMITTING DIODE GROWN BY SOLID SOURCE SI MOLECULAR-BEAM EPITAXY

被引:34
作者
FUKATSU, S [1 ]
USAMI, N [1 ]
SHIRAKI, Y [1 ]
NISHIDA, A [1 ]
NAKAGAWA, K [1 ]
机构
[1] HITACHI LTD,CENT RES LAB,1-280 HIGASHI KOIGAKUBO,KOKUBUNJI,TOKYO 182,JAPAN
关键词
D O I
10.1063/1.109860
中图分类号
O59 [应用物理学];
学科分类号
摘要
Electroluminescence (EL) was observed at temperatures up to 60-degrees-C in p-type strained Si0.65Ge0.35/Si multiple-quantum-well (MQW) diode structures grown on Si (111) substrates by Si molecular-beam epitaxy. No-phonon line and its transverse optical phonon replica were well-resolved in the room-temperature EL spectrum for the first time. EL spectrum was dominated by a broad alloy band located below the band-edge state by almost-equal-to 100 meV at lower temperatures, which was taken over by clear band-edge emissions at elevated temperatures. The emission intensity of the alloy band exhibited a saturation behavior with increasing injection current while the band-edge emission was found to develop with a power exponent of 1.4.
引用
收藏
页码:967 / 969
页数:3
相关论文
共 17 条
  • [1] SYSTEMATIC BLUE SHIFT OF EXCITON LUMINESCENCE IN STRAINED SI1-XGEX/SI QUANTUM-WELL STRUCTURES GROWN BY GAS SOURCE SILICON MOLECULAR-BEAM EPITAXY
    FUKATSU, S
    YOSHIDA, H
    USAMI, N
    FUJIWARA, A
    TAKAHASHI, Y
    SHIRAKI, Y
    ITO, R
    [J]. THIN SOLID FILMS, 1992, 222 (1-2) : 1 - 4
  • [2] ELECTROLUMINESCENCE FROM STRAINED SIGE/SI QUANTUM-WELL STRUCTURES GROWN BY SOLID SOURCE SI MOLECULAR-BEAM EPITAXY
    FUKATSU, S
    USAMI, N
    CHINZEI, T
    SHIRAKI, Y
    NISHIDA, A
    NAKAGAWA, K
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1992, 31 (8A): : L1015 - L1017
  • [3] PHOTOGENERATION AND TRANSPORT OF CARRIERS IN STRAINED SI1-XGEX/SI QUANTUM-WELL STRUCTURES
    FUKATSU, S
    USAMI, N
    SHIRAKI, Y
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1992, 31 (11A): : L1525 - L1528
  • [4] FUKATSU S, UNPUB
  • [5] FUKATSU S, 1992, JPN J APPL PHYS, V31, pL1017
  • [6] B DOPING EFFECT ON REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION INTENSITY OSCILLATION DURING GAS SOURCE SILICON MOLECULAR-BEAM EPITAXIAL-GROWTH
    HIRAYAMA, H
    KOYAMA, K
    HIROI, M
    TATSUMI, T
    [J]. APPLIED PHYSICS LETTERS, 1990, 57 (08) : 780 - 782
  • [7] HOUGHTON DC, 1991, MATER RES SOC SYMP P, V220, P299, DOI 10.1557/PROC-220-299
  • [8] HIGH QUANTUM EFFICIENCY PHOTOLUMINESCENCE FROM LOCALIZED EXCITONS IN SI1-XGEX
    LENCHYSHYN, LC
    THEWALT, MLW
    STURM, JC
    SCHWARTZ, PV
    PRINZ, EJ
    ROWELL, NL
    NOEL, JP
    HOUGHTON, DC
    [J]. APPLIED PHYSICS LETTERS, 1992, 60 (25) : 3174 - 3176
  • [9] OBSERVATION OF ELECTROLUMINESCENCE FROM PSEUDOMORPHIC SI1-XGEX ALLOY LAYERS
    MANTZ, U
    THONKE, K
    SAUER, R
    KASPER, E
    KIBBEL, H
    SCHAFFLER, F
    HERZOG, HJ
    [J]. THIN SOLID FILMS, 1992, 222 (1-2) : 94 - 97
  • [10] ROOM-TEMPERATURE 1.3-MU-M ELECTROLUMINESCENCE FROM STRAINED SI1-XGEX/SI QUANTUM-WELLS
    MI, Q
    XIAO, X
    STURM, JC
    LENCHYSHYN, LC
    THEWALT, MLW
    [J]. APPLIED PHYSICS LETTERS, 1992, 60 (25) : 3177 - 3179