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HIGH-RESOLUTION, LOW-ENERGY AVALANCHE PHOTODIODE X-RAY-DETECTORS

被引：35
作者：
FARRELL, R
VANDERPUYE, K
ENTINE, G
SQUILLANTE, MR
机构：
[1] Radiation Monitoring Devices, Inc., Watertown, MA, 02172
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1991年 / 38卷 / 02期
基金：
美国国家航空航天局;
关键词：
D O I：
10.1109/23.289288
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Silicon avalanche photodiodes have been fabricated and their performance as X-ray detectors has been measured. Photon sensitivity and energy resolution was measured as a function of size and operating parameters. Noise thresholds as low as 212 eV were obtained at room temperature and backscatter X-ray fluorescence data was obtained for aluminum and other light elements.
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页码：144 / 147
页数：4
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