TEMPERATURE STABILIZED SAMPLE STAGE FOR THE INVESTIGATION OF HIGH-TC SUPERCONDUCTORS BY SCANNING ELECTRON-MICROSCOPY

被引：22

作者：

GROSS, R

BOSCH, J

WENER, HG

FISCHER, J

HUEBENER, RP

机构：

来源：

CRYOGENICS | 1989年 / 29卷 / 07期

关键词：

D O I：

10.1016/0011-2275(89)90137-9

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

引用

页码：716 / 719

页数：4

共 13 条

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[2] INHOMOGENEITIES IN ARRAYS OF JOSEPHSON-JUNCTIONS - THEIR IMAGING BY LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY [J].

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GROSS, R ;

HUEBENER, RP ;

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[3] SPATIALLY RESOLVED OBSERVATION OF THE CRITICAL CURRENT IN HIGH-TC SUPERCONDUCTING FILMS [J].

GROSS, R ;

BOSCH, J ;

HUEBENER, RP ;

MANNHART, J ;

TSUEI, CC ;

SCHEUERMANN, M ;

OPRYSKO, MM ;

CHI, CC .

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[4]

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[5]

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[6]

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[7] APPLICATIONS OF LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY [J].

HUEBENER, RP .

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[8] LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY FOR STUDYING INHOMOGENEITIES IN THIN-FILM HIGH-TC SUPERCONDUCTORS [J].

HUEBENER, RP ;

GROSS, R ;

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[9]

HUEBENER RP, 1988, ADV ELECTRON EL PHYS, V70, P1

[10]

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