INHOMOGENEITIES IN ARRAYS OF JOSEPHSON-JUNCTIONS - THEIR IMAGING BY LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY

被引：9

作者：

BOSCH, J ^{[1
]}

GROSS, R ^{[1
]}

HUEBENER, RP ^{[1
]}

NIEMEYER, J ^{[1
]}

机构：

[1] PHYS TECH BUNDESANSTALT,D-3300 BRUNSWICK,FED REP GER

来源：

APPLIED PHYSICS LETTERS | 1985年 / 47卷 / 09期

关键词：

D O I：

10.1063/1.95970

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1004 / 1006

页数：3

共 12 条

[1] DIRECT PROBING OF THE SPATIAL-DISTRIBUTION OF THE MAXIMUM JOSEPHSON CURRENT IN A SUPERCONDUCTING TUNNEL JUNCTION [J].

BOSCH, J ;

GROSS, R ;

KOYANAGI, M ;

HUEBENER, RP .

PHYSICAL REVIEW LETTERS, 1985, 54 (13) :1448-1451

[2] APPLICATION OF LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY TO SUPERCONDUCTORS [J].

CLEM, JR ;

HUEBENER, RP .

JOURNAL OF APPLIED PHYSICS, 1980, 51 (05) :2764-2773

[3] TWO-DIMENSIONAL IMAGING OF THE CURRENT-DENSITY DISTRIBUTION IN SUPERCONDUCTING TUNNEL-JUNCTIONS [J].

EPPERLEIN, PW ;

SEIFERT, H ;

HUEBENER, RP .

PHYSICS LETTERS A, 1982, 92 (03) :146-150

[4] PROBING OF ENERGY-GAP DISTRIBUTION IN SUPERCONDUCTING TUNNEL-JUNCTIONS BY LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY [J].

GROSS, R ;

KOYANAGI, M ;

SEIFERT, H ;

HUEBENER, RP .

PHYSICS LETTERS A, 1985, 109 (06) :298-302

[5] COHERENT ARRAYS OF THIN-FILM JOSEPHSON MICROBRIDGES [J].

HANSEN, JB ;

LINDELOF, PE ;

FINNEGAN, TF .

IEEE TRANSACTIONS ON MAGNETICS, 1981, 17 (01) :95-98

[6] STATIC AND DYNAMIC INTERACTIONS BETWEEN JOSEPHSON-JUNCTIONS [J].

HANSEN, JB ;

LINDELOF, PE .

REVIEWS OF MODERN PHYSICS, 1984, 56 (03) :431-459

[7] PHASE-TRANSITIONS IN ARRAYS OF JOSEPHSON-JUNCTIONS [J].

LOBB, CJ .

PHYSICA B & C, 1984, 126 (1-3) :319-325

[8] MICROWAVE-INDUCED CONSTANT-VOLTAGE STEPS AT ONE VOLT FROM A SERIES ARRAY OF JOSEPHSON-JUNCTIONS [J].

NIEMEYER, J ;

HINKEN, JH ;

KAUTZ, RL .

APPLIED PHYSICS LETTERS, 1984, 45 (04) :478-480

[9] MICROWAVE-INDUCED CONSTANT VOLTAGE STEPS AT SERIES ARRAYS OF JOSEPHSON TUNNEL-JUNCTIONS WITH NEAR-ZERO CURRENT BIAS [J].

NIEMEYER, J ;

HINKEN, JH ;

MEIER, W .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1984, 33 (04) :311-315

[10] HIGH-RESOLUTION IMAGING OF INHOMOGENEITIES IN SUPERCONDUCTING TUNNEL-JUNCTIONS BY SCANNING WITH A MODULATED ELECTRON-BEAM [J].

SEIFERT, H ;

HUEBENER, RP ;

EPPERLEIN, PW .

PHYSICS LETTERS A, 1983, 97 (09) :421-423

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