PROBING OF ENERGY-GAP DISTRIBUTION IN SUPERCONDUCTING TUNNEL-JUNCTIONS BY LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY

被引：8

作者：

GROSS, R

KOYANAGI, M

SEIFERT, H

HUEBENER, RP

机构：

来源：

PHYSICS LETTERS A | 1985年 / 109卷 / 06期

关键词：

D O I：

10.1016/0375-9601(85)90620-6

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：298 / 302

页数：5

共 11 条

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[4] TWO-DIMENSIONAL IMAGING OF THE CURRENT-DENSITY DISTRIBUTION IN SUPERCONDUCTING TUNNEL-JUNCTIONS [J].

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SEIFERT, H ;

HUEBENER, RP .

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[5]

GROSS R, 1984, P LT17, V1, P431

[6]

GROSS R, UNPUB

[7] RESOLUTION LIMIT DUE TO THERMAL EFFECTS IN LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY [J].

PAVLICEK, H ;

FREYTAG, L ;

SEIFERT, H ;

HUEBENER, RP .

JOURNAL OF LOW TEMPERATURE PHYSICS, 1984, 56 (3-4) :237-257

[8] DIRECT PROBING BY LASER SCANNING OF THE CURRENT DISTRIBUTION AND INHOMOGENEITY OF JOSEPHSON-JUNCTIONS [J].

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CHEN, JT .

PHYSICAL REVIEW LETTERS, 1983, 50 (01) :74-77

[9] LIQUID-HELIUM COOLED SAMPLE STAGE FOR SCANNING ELECTRON-MICROSCOPE [J].

SEIFERT, H .

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[10] HIGH-RESOLUTION IMAGING OF INHOMOGENEITIES IN SUPERCONDUCTING TUNNEL-JUNCTIONS BY SCANNING WITH A MODULATED ELECTRON-BEAM [J].

SEIFERT, H ;

HUEBENER, RP ;

EPPERLEIN, PW .

PHYSICS LETTERS A, 1983, 97 (09) :421-423

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