RESOLUTION LIMIT DUE TO THERMAL EFFECTS IN LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY

被引：16

作者：

PAVLICEK, H

FREYTAG, L

SEIFERT, H

HUEBENER, RP

机构：

来源：

JOURNAL OF LOW TEMPERATURE PHYSICS | 1984年 / 56卷 / 3-4期

关键词：

D O I：

10.1007/BF00681443

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：237 / 257

页数：21

共 11 条

[1] APPLICATION OF LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY TO SUPERCONDUCTORS [J].

CLEM, JR ;

HUEBENER, RP .

JOURNAL OF APPLIED PHYSICS, 1980, 51 (05) :2764-2773

[2] TWO-DIMENSIONAL IMAGING OF HOTSPOTS IN SUPERCONDUCTING BRIDGES BY LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY [J].

EICHELE, R ;

FREYTAG, L ;

SEIFERT, H ;

HUEBENER, RP ;

CLEM, JR .

JOURNAL OF LOW TEMPERATURE PHYSICS, 1983, 52 (5-6) :449-479

[3] FORMATION OF HOT SPOTS IN A SUPERCONDUCTOR OBSERVED BY LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY [J].

EICHELE, R ;

SEIFERT, H ;

HUEBENER, RP .

APPLIED PHYSICS LETTERS, 1981, 38 (05) :383-384

[4] TWO-DIMENSIONAL IMAGING OF THE CURRENT-DENSITY DISTRIBUTION IN SUPERCONDUCTING TUNNEL-JUNCTIONS [J].

EPPERLEIN, PW ;

SEIFERT, H ;

HUEBENER, RP .

PHYSICS LETTERS A, 1982, 92 (03) :146-150

[5] DEFLECTION BEAM-CHOPPING IN SEM [J].

GOPINATH, A ;

HILL, MS .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1977, 10 (03) :229-236

[6]

MENZEL E, 1978, BEITRAGE ELEKTRONENM, V11, P47

[7] EXAMINATION OF SUPERCONDUCTING MICRO-CIRCUITS BY LOW-TEMPERATURE-SCANNING-ELECTRON-MICROSCOPY [J].

PAVLICEK, H ;

FREYTAG, L ;

HUEBENER, RP ;

SEIFERT, H .

IEEE TRANSACTIONS ON MAGNETICS, 1983, 19 (03) :1296-1299

[8]

PAVLICEK H, 1983, THESIS U TUBINGEN

[9] LIQUID-HELIUM COOLED SAMPLE STAGE FOR SCANNING ELECTRON-MICROSCOPE [J].

SEIFERT, H .

CRYOGENICS, 1982, 22 (12) :657-660

[10] HIGH-RESOLUTION IMAGING OF INHOMOGENEITIES IN SUPERCONDUCTING TUNNEL-JUNCTIONS BY SCANNING WITH A MODULATED ELECTRON-BEAM [J].

SEIFERT, H ;

HUEBENER, RP ;

EPPERLEIN, PW .

PHYSICS LETTERS A, 1983, 97 (09) :421-423

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