EXAMINATION OF SUPERCONDUCTING MICRO-CIRCUITS BY LOW-TEMPERATURE-SCANNING-ELECTRON-MICROSCOPY

[1] APPLICATION OF LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY TO SUPERCONDUCTORS [J]. JOURNAL OF APPLIED PHYSICS, 1980, 51 (05) : 2764 - 2773

[2] EICHELE R, 1981, PHYSICA B & C, V108, P1029, DOI 10.1016/0378-4363(81)90818-4

[3] FORMATION OF HOT SPOTS IN A SUPERCONDUCTOR OBSERVED BY LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY [J]. APPLIED PHYSICS LETTERS, 1981, 38 (05) : 383 - 384

[4] TWO-DIMENSIONAL IMAGING OF THE CURRENT-DENSITY DISTRIBUTION IN SUPERCONDUCTING TUNNEL-JUNCTIONS [J]. PHYSICS LETTERS A, 1982, 92 (03) : 146 - 150

[5] PROJECTION PHOTOLITHOGRAPHY-LIFTOFF TECHNIQUES FOR PRODUCTION OF 0.2-MU-M METAL PATTERNS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (11) : 1375 - 1378

[6] LIQUID-HELIUM COOLED SAMPLE STAGE FOR SCANNING ELECTRON-MICROSCOPE [J]. CRYOGENICS, 1982, 22 (12) : 657 - 660

[7] SEIFERT H, UNPUB IMAGING SPATIA

[1] APPLICATION OF LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY TO SUPERCONDUCTORS [J]. JOURNAL OF APPLIED PHYSICS, 1980, 51 (05) : 2764 - 2773

[2] EICHELE R, 1981, PHYSICA B & C, V108, P1029, DOI 10.1016/0378-4363(81)90818-4

[3] FORMATION OF HOT SPOTS IN A SUPERCONDUCTOR OBSERVED BY LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY [J]. APPLIED PHYSICS LETTERS, 1981, 38 (05) : 383 - 384

[4] TWO-DIMENSIONAL IMAGING OF THE CURRENT-DENSITY DISTRIBUTION IN SUPERCONDUCTING TUNNEL-JUNCTIONS [J]. PHYSICS LETTERS A, 1982, 92 (03) : 146 - 150

[5] PROJECTION PHOTOLITHOGRAPHY-LIFTOFF TECHNIQUES FOR PRODUCTION OF 0.2-MU-M METAL PATTERNS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (11) : 1375 - 1378

[6] LIQUID-HELIUM COOLED SAMPLE STAGE FOR SCANNING ELECTRON-MICROSCOPE [J]. CRYOGENICS, 1982, 22 (12) : 657 - 660

[7] SEIFERT H, UNPUB IMAGING SPATIA