X-RAY-DIFFRACTION CHARACTERIZATION OF TERNARY ARTIFICIAL SUPERLATTICES

被引：13

作者：

GOLDFARB, I

ZOLOTOYABKO, E

SHECHTMAN, D

机构：

[1] Department of Materials Engineering, Technion-Israel Institute of Technology

来源：

JOURNAL OF APPLIED PHYSICS | 1993年 / 74卷 / 04期

关键词：

D O I：

10.1063/1.354689

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Thin films of alternating Au, Ag, and Cu wedge-shaped metal layers were made by magnetron sputtering in order to develop a method for investigation of a multicomponent systems. X-ray-diffraction patterns of all as-deposited samples revealed satellites in the vicinity of (111) reflections, evidence of composition-modulated artificial superlattice formation. The experimental spectra are well explained by the kinematical diffraction theory for imperfect superlattices. Computer simulations have demonstrated extremely high sensitivity to the fluctuations DELTAH/H of the superlattice period H. As a result, a rapid and simple method of DELTAH/H determination is proposed.

引用

页码：2501 / 2506

页数：6

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