X-RAY-DIFFRACTION OF MULTILAYERS AND SUPERLATTICES

[1] X-RAY DOUBLE-CRYSTAL DIFFRACTOMETRY OF GA1-XALXAS EPITAXIAL LAYERS [J]. JOURNAL OF CRYSTAL GROWTH, 1978, 44 (05) : 518 - 525

[2] CHARACTERIZATION OF THIN-LAYERS ON PERFECT CRYSTALS WITH A MULTIPURPOSE HIGH-RESOLUTION X-RAY DIFFRACTOMETER [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (02): : 338 - 345

[3] BONSE U, 1977, XRAY OPTICS, P93

[4] Born M, 1980, PRINCIPLES OPTICS

[5] EFFECT OF CRYSTAL PERFECTION AND POLARITY ON ABSORPTION EDGES SEEN IN BRAGG DIFFRACTION [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (07) : 2227 - &

[6] Darwin CG, 1914, PHILOS MAG, V27, P675, DOI 10.1080/14786440408635139

[7] The theory of X-ray reflexion. [J]. PHILOSOPHICAL MAGAZINE, 1914, 27 (157-62) : 315 - 333

[8] Ewald PP, 1917, ANN PHYS-BERLIN, V54, P519

[9] SOME PROPERTIES OF SINGLE-CRYSTAL ROCKING CURVE IN BRAGG CASE [J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1971, A 27 (MAY1) : 280 - &

[10] THE INTERPRETATION OF X-RAY ROCKING CURVES FROM III-V SEMICONDUCTOR-DEVICE STRUCTURES [J]. JOURNAL OF CRYSTAL GROWTH, 1984, 68 (02) : 523 - 531

[1] X-RAY DOUBLE-CRYSTAL DIFFRACTOMETRY OF GA1-XALXAS EPITAXIAL LAYERS [J]. JOURNAL OF CRYSTAL GROWTH, 1978, 44 (05) : 518 - 525

[2] CHARACTERIZATION OF THIN-LAYERS ON PERFECT CRYSTALS WITH A MULTIPURPOSE HIGH-RESOLUTION X-RAY DIFFRACTOMETER [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (02): : 338 - 345

[3] BONSE U, 1977, XRAY OPTICS, P93

[4] Born M, 1980, PRINCIPLES OPTICS

[5] EFFECT OF CRYSTAL PERFECTION AND POLARITY ON ABSORPTION EDGES SEEN IN BRAGG DIFFRACTION [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (07) : 2227 - &

[6] Darwin CG, 1914, PHILOS MAG, V27, P675, DOI 10.1080/14786440408635139

[7] The theory of X-ray reflexion. [J]. PHILOSOPHICAL MAGAZINE, 1914, 27 (157-62) : 315 - 333

[8] Ewald PP, 1917, ANN PHYS-BERLIN, V54, P519

[9] SOME PROPERTIES OF SINGLE-CRYSTAL ROCKING CURVE IN BRAGG CASE [J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1971, A 27 (MAY1) : 280 - &

[10] THE INTERPRETATION OF X-RAY ROCKING CURVES FROM III-V SEMICONDUCTOR-DEVICE STRUCTURES [J]. JOURNAL OF CRYSTAL GROWTH, 1984, 68 (02) : 523 - 531