X-RAY DOUBLE-CRYSTAL DIFFRACTOMETRY OF GA1-XALXAS EPITAXIAL LAYERS

[1] ASYMMETRY OF MISFIT DISLOCATIONS IN HETEROEPITAXIAL LAYERS ON (001) GAAS SUBSTRATES [J]. JOURNAL OF CRYSTAL GROWTH, 1977, 37 (03) : 204 - 214

[2] X-RAY PENDELLOSUNG FRINGES IN DARWIN REFLECTION [J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 : 150 - +

[3] BERGER H, 1972, KRISTALL TECHNIK, V7, P403

[4] CALCULATED ELASTIC-CONSTANTS FOR STRESS PROBLEMS ASSOCIATED WITH SEMICONDUCTOR DEVICES [J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (01) : 534 - 535

[5] Druzhinina L. V., 1975, Soviet Physics - Technical Physics, V19, P935

[6] DOUBLE-CRYSTAL SPECTROMETER MEASUREMENTS OF LATTICE-PARAMETERS AND X-RAY TOPOGRAPHY ON HETEROJUNCTIONS GAAS-ALXGA1-XAS [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1976, 32 (JUL1): : 627 - &

[7] THERMAL EXPANSION OF ALAS [J]. JOURNAL OF APPLIED PHYSICS, 1970, 41 (10) : 3926 - +

[8] HALLIWELL MAG, 1972, I PHYS C SER, P98

[9] VARIATION OF BRAGG-CASE DIFFRACTION CURVES OF X-RAYS FROM A THIN SILICON CRYSTAL WITH CRYSTAL THICKNESS [J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1970, 29 (03) : 806 - &

[10] MULTIPLE CRYSTAL SYSTEM FOR HIGH STRAIN SENSITIVITY X-RAY TOPOGRAPHY AND ITS APPLICATIONS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1975, 14 (10) : 1433 - 1441

[1] ASYMMETRY OF MISFIT DISLOCATIONS IN HETEROEPITAXIAL LAYERS ON (001) GAAS SUBSTRATES [J]. JOURNAL OF CRYSTAL GROWTH, 1977, 37 (03) : 204 - 214

[2] X-RAY PENDELLOSUNG FRINGES IN DARWIN REFLECTION [J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 : 150 - +

[3] BERGER H, 1972, KRISTALL TECHNIK, V7, P403

[4] CALCULATED ELASTIC-CONSTANTS FOR STRESS PROBLEMS ASSOCIATED WITH SEMICONDUCTOR DEVICES [J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (01) : 534 - 535

[5] Druzhinina L. V., 1975, Soviet Physics - Technical Physics, V19, P935

[6] DOUBLE-CRYSTAL SPECTROMETER MEASUREMENTS OF LATTICE-PARAMETERS AND X-RAY TOPOGRAPHY ON HETEROJUNCTIONS GAAS-ALXGA1-XAS [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1976, 32 (JUL1): : 627 - &

[7] THERMAL EXPANSION OF ALAS [J]. JOURNAL OF APPLIED PHYSICS, 1970, 41 (10) : 3926 - +

[8] HALLIWELL MAG, 1972, I PHYS C SER, P98

[9] VARIATION OF BRAGG-CASE DIFFRACTION CURVES OF X-RAYS FROM A THIN SILICON CRYSTAL WITH CRYSTAL THICKNESS [J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1970, 29 (03) : 806 - &

[10] MULTIPLE CRYSTAL SYSTEM FOR HIGH STRAIN SENSITIVITY X-RAY TOPOGRAPHY AND ITS APPLICATIONS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1975, 14 (10) : 1433 - 1441