THE FUNDAMENTAL ABSORPTION-EDGE OF CRYSTALLINE AND AMORPHOUS SIO2

被引：8

作者：

BOSIO, C

CZAJA, W

机构：

[1] EPFL,INST PHYS APPL,CH-1015 LAUSANNE,SWITZERLAND

[2] UNIV PAVIA,DIPARTIMENTO FIS,I-27100 PAVIA,ITALY

来源：

EUROPHYSICS LETTERS | 1993年 / 24卷 / 03期

关键词：

D O I：

10.1209/0295-5075/24/3/007

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Kramers-Kronig-transformed reflectivity spectra of alpha-crystalline SiO2 are compared to absorption data (E less-than-or-equal-to 8.8 eV) and farther analysed in the energy range 8 eV less-than-or-equal-to E less-than-or-equal-to 10.5 eV. We find a good agreement with the transmission measurements, and for 9.3 less-than-or-equal-to E less-than-or-equal-to 9.7 eV a (E - E(g))3/2-dependence for the absorption coefficient with E(g) = (9.3 +/- 0.1) eV in alpha-SiO2. Our results are compared to excitation spectra of the self-trapped exciton in alpha-SiO2 and to the parity forbidden transition in Cu2O. Although qualitatively similar, the results in amorphous SiO2 show a number of quantitative differences.

引用

页码：197 / 201

页数：5

共 17 条

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