UHV SYSTEMS FOR SURFACE STUDIES BY ION SCATTERING

被引：9

作者：

WHEATLEY, GH ^{[1
]}

CALDWELL, CW ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1973年 / 44卷 / 06期

关键词：

D O I：

10.1063/1.1686235

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：744 / 747

页数：4

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[2] CHARGE STATES OF 25-150 KEV H AND HE-4 BACKSCATTERED FROM SOLID SURFACES
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[3] STUDIES OF SOLID SURFACES WITH 100 KEV 4HE+ AND H+ ION-BEAMS
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[6] SCATTERING OF LOW-ENERGY NOBLE GAS IONS FROM METAL SURFACES
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[7] A NEW APPROACH TO MEASURE ION REFLECTION AND SECONDARY ION EMISSION DURING ION BOMBARDMENT OF ATOMICALLY CLEAN AND SMOOTH MONOCRYSTALLINE METAL SURFACES
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