PROBING GUNN DOMAINS AT X-BAND MICROWAVE-FREQUENCIES USING A SCANNING MICROSCOPE

被引：13

作者：

HILL, MS ^{[1
]}

GOPINATH, A ^{[1
]}

机构：

[1] UNIV COLL N WALES,SCH ELECTR ENGN SCI,DEAN ST,BANGOR,CAERNARVONSHIRE,WALES

来源：

关键词：

D O I：

10.1088/0022-3727/7/1/315

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：69 / &

共 9 条

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BANBURY, JR
NIXON, WC
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[2] GOPINATH A, 1971, J PHYS E SCI INSTRUM, V4, P610
[3] GOPINATH A, 1970, 7TH P INT C EL MICR, V1, P203
[4] Hachenberg O., 1959, ADVAN ELECTRON ELECT, V11, P413
[5] TIME-RESOLVED SCANNING ELECTRON MICROSCOPY AND ITS APPLICATION TO BULK-EFFECT OSCILLATORS
MACDONALD, NC
ROBINSON, GY
WHITE, RM
[J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (11) : 4516 - +
[6] ISOLATION OF POTENTIAL CONTRAST IN SCANNING ELECTRON MICROSCOPE
OATLEY, CW
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08): : 742 - &
[7] STROBOSCOPIC SCANNING ELECTRON MICROSCOPY
PLOWS, GS
NIXON, WC
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (06): : 595 - &
[8] STROBOSCOPIC SCANNING ELECTRON MICROSCOPY AT GIGAHERTZ FREQUENCIES
ROBINSON, GY
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (02) : 251 - &
[9] WELLS OC, 1972, 5TH P ANN SCANN EL M, P375