HIGH-VOLTAGE ELECTRON MICROSCOPE

被引：11

作者：

COSSLETT, VE

机构：

[1] Cavendish Laboratory, University of Cambridge

来源：

CONTEMPORARY PHYSICS | 1968年 / 9卷 / 04期

关键词：

D O I：

10.1080/00107516808220089

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The advantages of using very high voltages for electron microscopy are reviewed, in respect of greater specimen thickness and reduced chromatic aberration. For polymers and possibly with living material, the lower radiation damage in a given thickness is also valuable. The special problems in the design and construction of microscopes operating up to 1 Mv are discussed. We are still in a stage of rapid development, and some possibilities for the future are outlined. The main areas of application of high voltage microscopes are beginning to be defined; some examples are given of what has been done with the Toulouse and Cambridge microscopes to date. © Taylor and Francis Group, LLC.

引用

页码：333 / &

共 37 条

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[4]

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[5]

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[10]

DUPOUY G, 1961, CR HEBD ACAD SCI, V253, P2435

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