SPECIMEN THICKNESS AND IMAGE RESOLUTION IN ELECTRON MICROSCOPY

[1] A POSSIBLE CHROMATIC CORRECTION SYSTEM FOR ELECTRON LENSES [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1955, 68 (11): : 817 - 829

[2] Bethe H., 1933, HDB PHYS, V24, P273

[3] GEGENFELDFILTER FUR ELEKTRONENBEUGUNG UND ELEKTRONENMIKROSKOPIE [J]. ZEITSCHRIFT FUR PHYSIK, 1953, 134 (02): : 156 - 164

[4] BOERSCH H, 1949, OPTIK, V5, P436

[5] BOERSCH H, 1947, Z NATURFORSCH A, V2, P615

[6] COSSLETT VE, 1951, PRACTICAL ELECTRON M, P198

[7] THE PENETRATION OF ELECTRONS INTO LUMINESCENT MATERIAL [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1953, 66 (408): : 1057 - 1066

[8] EXPERIMENTAL EVIDENCE FOR THE COLLECTIVE NATURE OF THE CHARACTERISTIC ELECTRON-ENERGY LOSSES IN SOLIDS [J]. NATURE, 1955, 175 (4460) : 718 - 720

[9] THE APPLICATION AND LIMITATIONS OF THE EDGE-DIFFRACTION TEST FOR ASTIGMATISM IN THE ELECTRON MICROSCOPE [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1954, 31 (09): : 326 - 332

[10] HAINE ME, 1955, APR C CTR NAT RECH S

[1] A POSSIBLE CHROMATIC CORRECTION SYSTEM FOR ELECTRON LENSES [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1955, 68 (11): : 817 - 829

[2] Bethe H., 1933, HDB PHYS, V24, P273

[3] GEGENFELDFILTER FUR ELEKTRONENBEUGUNG UND ELEKTRONENMIKROSKOPIE [J]. ZEITSCHRIFT FUR PHYSIK, 1953, 134 (02): : 156 - 164

[4] BOERSCH H, 1949, OPTIK, V5, P436

[5] BOERSCH H, 1947, Z NATURFORSCH A, V2, P615

[6] COSSLETT VE, 1951, PRACTICAL ELECTRON M, P198

[7] THE PENETRATION OF ELECTRONS INTO LUMINESCENT MATERIAL [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1953, 66 (408): : 1057 - 1066

[8] EXPERIMENTAL EVIDENCE FOR THE COLLECTIVE NATURE OF THE CHARACTERISTIC ELECTRON-ENERGY LOSSES IN SOLIDS [J]. NATURE, 1955, 175 (4460) : 718 - 720

[9] THE APPLICATION AND LIMITATIONS OF THE EDGE-DIFFRACTION TEST FOR ASTIGMATISM IN THE ELECTRON MICROSCOPE [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1954, 31 (09): : 326 - 332

[10] HAINE ME, 1955, APR C CTR NAT RECH S