ON THE SUITABILITY OF THE DOWN-ZONE IMAGING TECHNIQUE TO THE STUDY OF RADIATION-DAMAGE

被引：21

作者：

BENCH, MW

TAPPIN, DK

ROBERTSON, IM

机构：

[1] University of Illinois, Urbana, IL

来源：

PHILOSOPHICAL MAGAZINE LETTERS | 1992年 / 66卷 / 01期

关键词：

D O I：

10.1080/09500839208206011

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A comparison has been made of the defect image contrast obtained using conventional two-beam dark-field and the bright-field down-zone techniques. It is shown that better resolution and contrast of isolated amorphous zones in GaAs and vacancy loops in a Ag-Pd alloy are obtained in the down-zone images.

引用

页码：39 / 45

页数：7

共 11 条

[1]

[Anonymous], 1987, MAT SCI FORUM, DOI DOI 10.4028/www.scientific.net/MSF.15-18.1023

[2] ON DIFFRACTION CONTRAST FROM INCLUSIONS [J].

ASHBY, MF ;

BROWN, LM .

PHILOSOPHICAL MAGAZINE, 1963, 8 (94) :1649-&

[3]

BENCH MW, 1992, MATER RES SOC SYMP P, V235, P27

[4] ELECTRON MICROSCOPE IMAGE CONTRAST FROM DISLOCATION LOOPS [J].

BULLOUGH, R ;

MAHER, DM ;

PERRIN, RC .

PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1971, 43 (02) :689-&

[5]

HIRSCH PB, 1965, ELECTRON MICROSCOPY

[6] WEAK-BEAM ELECTRON-MICROSCOPY ANALYSIS OF DEFECT CLUSTERS IN HEAVY-ION IRRADIATED SILVER AND COPPER [J].

JENKINS, ML .

PHILOSOPHICAL MAGAZINE, 1974, 29 (04) :813-828

[7] COMPUTER SIMULATION OF ELECTRON MICROSCOPE IMAGES [J].

MAHER, DM ;

PERRIN, RC ;

BULLOUGH, R .

PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1971, 43 (02) :707-&

[8] STRAIN CONTRAST OF COHERENT PRECIPITATES IN BRIGHT-FIELD IMAGES UNDER ZONE AXIS INCIDENCE [J].

MATSUMURA, S ;

TOYOHARA, M ;

TOMOKIYO, Y .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1990, 62 (06) :653-670

[9] ON THE FORMATION OF VACANCY TYPE DISLOCATION LOOPS FROM DISPLACEMENT CASCADES IN NICKEL [J].

ROBERTSON, IM ;

VETRANO, JS ;

KIRK, MA ;

JENKINS, ML .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1991, 63 (02) :299-318

[10] EMS - A SOFTWARE PACKAGE FOR ELECTRON-DIFFRACTION ANALYSIS AND HREM IMAGE SIMULATION IN MATERIALS SCIENCE [J].

STADELMANN, PA .

ULTRAMICROSCOPY, 1987, 21 (02) :131-145

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