SELECTED AREA AND IN-DEPTH AUGER ANALYSIS OF THIN-FILMS

[1] Berry R.W., 1968, THIN FILM TECHNOLOGY

[2] TANTALUM PRINTED CAPACITORS [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1959, 47 (06): : 1070 - 1075

[3] AUGER SPECTROSCOPY OF TITANIUM [J]. SURFACE SCIENCE, 1971, 24 (01) : 1 - &

[4] ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) : 1740 - &

[5] BOROVSKII IB, 1972, 7 P NATL C EL PROB A

[6] BRUINING H, 1954, PHYSICS APPLICATIONS

[7] BURBANK RD, IN PRESS

[8] COLBY JW, 1971, 6TH P NATL C EL PROB

[9] STRUCTURE AND COMPOSITION OF SPUTTERED TANTALUM THIN-FILMS ON SILICON STUDIED BY NUCLEAR AND X-RAY ANALYSIS [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (04) : 1444 - &

[10] STRUCTURE AND ELECTRICAL PROPERTIES OF TA FILMS SPUTTERED IN AR-O2 [J]. THIN SOLID FILMS, 1972, 10 (01) : 79 - +

[1] Berry R.W., 1968, THIN FILM TECHNOLOGY

[2] TANTALUM PRINTED CAPACITORS [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1959, 47 (06): : 1070 - 1075

[3] AUGER SPECTROSCOPY OF TITANIUM [J]. SURFACE SCIENCE, 1971, 24 (01) : 1 - &

[4] ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) : 1740 - &

[5] BOROVSKII IB, 1972, 7 P NATL C EL PROB A

[6] BRUINING H, 1954, PHYSICS APPLICATIONS

[7] BURBANK RD, IN PRESS

[8] COLBY JW, 1971, 6TH P NATL C EL PROB

[9] STRUCTURE AND COMPOSITION OF SPUTTERED TANTALUM THIN-FILMS ON SILICON STUDIED BY NUCLEAR AND X-RAY ANALYSIS [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (04) : 1444 - &

[10] STRUCTURE AND ELECTRICAL PROPERTIES OF TA FILMS SPUTTERED IN AR-O2 [J]. THIN SOLID FILMS, 1972, 10 (01) : 79 - +