EFFECT OF THERMODYNAMICS ON ION MIXING

[1] DEPTH RESOLUTION OF SPUTTER PROFILING [J]. APPLIED PHYSICS, 1979, 18 (02): : 131 - 140

[2] SHORT-RANGE AND LONG-RANGE ION-BEAM MIXING IN CU-AL - INFLUENCE OF INTERFACIAL OXIDE [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1982, 29 (03): : 141 - 145

[3] ION-BEAM MIXING OF NI-MO AND OF NI-TI BINARY-SYSTEMS [J]. JOURNAL OF APPLIED PHYSICS, 1985, 58 (01) : 248 - 252

[4] Cheng Y., UNPUB

[5] INFLUENCE OF CHEMICAL DRIVING FORCES IN ION MIXING OF METALLIC BILAYERS [J]. APPLIED PHYSICS LETTERS, 1984, 45 (02) : 185 - 187

[6] Chu W. K., 1978, BACKSCATTERING SPECT

[7] CORRELATION BETWEEN CHEMISTRY AND THE AMOUNT OF MIXING IN BILAYERS SUBMITTED TO ION-BOMBARDMENT [J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (04) : 1426 - 1429

[8] Haasen P., 1978, PHYS METALLURGY CAMB, P183

[9] WHEN IS THERMODYNAMICS RELEVANT TO ION-INDUCED ATOMIC REARRANGEMENTS IN METALS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 7-8 (MAR) : 657 - 665

[10] RAI AK, 1986, MATER RES SOC S P, V54, P231

[1] DEPTH RESOLUTION OF SPUTTER PROFILING [J]. APPLIED PHYSICS, 1979, 18 (02): : 131 - 140

[2] SHORT-RANGE AND LONG-RANGE ION-BEAM MIXING IN CU-AL - INFLUENCE OF INTERFACIAL OXIDE [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1982, 29 (03): : 141 - 145

[3] ION-BEAM MIXING OF NI-MO AND OF NI-TI BINARY-SYSTEMS [J]. JOURNAL OF APPLIED PHYSICS, 1985, 58 (01) : 248 - 252

[4] Cheng Y., UNPUB

[5] INFLUENCE OF CHEMICAL DRIVING FORCES IN ION MIXING OF METALLIC BILAYERS [J]. APPLIED PHYSICS LETTERS, 1984, 45 (02) : 185 - 187

[6] Chu W. K., 1978, BACKSCATTERING SPECT

[7] CORRELATION BETWEEN CHEMISTRY AND THE AMOUNT OF MIXING IN BILAYERS SUBMITTED TO ION-BOMBARDMENT [J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (04) : 1426 - 1429

[8] Haasen P., 1978, PHYS METALLURGY CAMB, P183

[9] WHEN IS THERMODYNAMICS RELEVANT TO ION-INDUCED ATOMIC REARRANGEMENTS IN METALS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 7-8 (MAR) : 657 - 665

[10] RAI AK, 1986, MATER RES SOC S P, V54, P231