DEPTH RESOLUTION OF SPUTTER PROFILING

被引:519
作者
ANDERSEN, HH
机构
来源
APPLIED PHYSICS | 1979年 / 18卷 / 02期
关键词
D O I
10.1007/BF00934407
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:131 / 140
页数:10
相关论文
共 49 条
  • [1] HEAVY-ION SPUTTERING YIELDS OF GOLD - FURTHER EVIDENCE OF NONLINEAR EFFECTS
    ANDERSEN, HH
    BAY, HL
    [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (06) : 2416 - 2422
  • [2] ANDERSEN HH, UNPUBLISHED
  • [3] ANDERSEN HH, 1974, PHYSICS IONIZED GASE, P361
  • [4] BORON-IMPLANTED PROFILES IN DIAMOND
    BLANCHARD, B
    COMBASSON, JL
    BOURGOIN, JC
    [J]. APPLIED PHYSICS LETTERS, 1976, 28 (01) : 7 - 8
  • [5] BUGER PA, 1977, Z NATURFORSCH A, V32, P144
  • [6] SPUTTERING IN SURFACE ANALYSIS OF SOLIDS - DISCUSSION OF SOME PROBLEMS
    COBURN, JW
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (05): : 1037 - 1044
  • [7] CATHODIC SPUTTERING FOR MICRO-DIFFUSION STUDIES
    FISHER, TF
    WEBER, CE
    [J]. JOURNAL OF APPLIED PHYSICS, 1952, 23 (02) : 181 - 183
  • [8] AUGER PROFILING OF ABRUPT LPE ALXGA1-XAS-GAAS HETEROJUNCTIONS
    GARNER, CM
    SHEN, YD
    KIM, JS
    PEARSON, GL
    SPICER, WE
    HARRIS, JS
    EDWALL, DD
    [J]. JOURNAL OF APPLIED PHYSICS, 1977, 48 (07) : 3147 - 3149
  • [9] GSCHNEIDNER KA, 1964, SOLID STATE PHYS, V16, P275
  • [10] ION-BEAM-INDUCED ATOMIC MIXING
    HAFF, PK
    SWITKOWSKI, ZE
    [J]. JOURNAL OF APPLIED PHYSICS, 1977, 48 (08) : 3383 - 3386