OPTICAL-PROPERTIES OF PLASMA POLYMER-FILMS (HEXAMETHYLDISILOXANE)

被引:19
作者
ROCHOTZKI, R
ARZT, M
BLASCHTA, F
KREYSSIG, E
POLL, HU
机构
[1] Technische Universität Chemnitz, Fachbereich Physik, O- 9010 Chemnitz
关键词
D O I
10.1016/0040-6090(93)90308-C
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin polymer films were deposited in an r.f. discharge of organic vapour (hexamethyldisiloxane (HMDSO)) in the pressure range 0.06-0.5 mbar. Plasma chemical gas conversion influences the deposition process and film properties, thereby producing a refractive index gradient in plasma polymer films. The relationship between the gas composition of the plasma and the changes of resultant film properties was in situ analysed by means of mass spectrometry and single-wavelength ellipsometry. The refractive index of the silicon-organic polymer films varies from 1.45 to above 2.0 over a thickness range of about 200 nm owing to changes in the molecular structure. The dispersion behaviour of HMDSO plasma polymer films and the depth profile of the refractive index were investigated by means of spectroscopic ellipsometry (300-800 nm). Additional investigations of the films confirm a change of film composition.
引用
收藏
页码:463 / 467
页数:5
相关论文
共 21 条
[1]  
Azzam RMA., 1999, ELLIPSOMETRY POLARIZ
[2]  
BORN M, 1932, OPTIK, P502
[3]   GLOW-DISCHARGE DEPOSITION OF SILICON DIOXIDE AND ALUMINUM-OXIDE FILMS - A KINETIC-MODEL OF THE SURFACE PROCESSES [J].
BOURREAU, C ;
CATHERINE, Y ;
GARCIA, P .
PLASMA CHEMISTRY AND PLASMA PROCESSING, 1990, 10 (02) :247-260
[4]   VARIABLE WAVELENGTH, VARIABLE ANGLE ELLIPSOMETRY INCLUDING A SENSITIVITIES CORRELATION TEST [J].
BUABBUD, GH ;
BASHARA, NM ;
WOOLLAM, JA .
THIN SOLID FILMS, 1986, 138 (01) :27-41
[5]   SPECTROSCOPIC ELLIPSOMETRY FOR THE CHARACTERIZATION OF THIN-FILMS [J].
FERRIEU, F ;
LECAT, JH .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1990, 137 (07) :2203-2208
[6]   FILM DEPOSITION IN A RADIAL FLOW REACTOR BY PLASMA POLYMERIZATION OF HEXAMETHYLDISILAZANE [J].
GERSTENBERG, KW .
COLLOID AND POLYMER SCIENCE, 1990, 268 (04) :345-355
[7]  
KAMILI R, 1988, PRODUCTRONIC, P80
[8]   HYBRID FILMS FORMED FROM HEXAMETHYLDISILOXANE AND SIO BY PLASMA PROCESS [J].
KASHIWAGI, K ;
YOSHIDA, Y ;
MURAYAMA, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (08) :1803-1807
[9]   GRADED-INDEX PLASTIC OPTICAL FIBER COMPOSED OF METHYL-METHACRYLATE AND VINYL PHENYLACETATE COPOLYMERS [J].
KOIKE, Y ;
NIHEI, E ;
TANIO, N ;
OHTSUKA, Y .
APPLIED OPTICS, 1990, 29 (18) :2686-2691
[10]   SPECTROSCOPIC ELLIPSOMETRY - A NEW TOOL FOR NONDESTRUCTIVE DEPTH PROFILING AND CHARACTERIZATION OF INTERFACES [J].
MCMARR, PJ ;
VEDAM, K ;
NARAYAN, J .
JOURNAL OF APPLIED PHYSICS, 1986, 59 (03) :694-701