SPONTANEOUS RESISTANCE SWITCHING AND LOW-FREQUENCY NOISE IN QUANTUM POINT CONTACTS

被引：91

作者：

DEKKER, C

SCHOLTEN, AJ

LIEFRINK, F

EPPENGA, R

VANHOUTEN, H

FOXON, CT

机构：

[1] STATE UNIV UTRECHT,DEBYE RES INST,3508 TA UTRECHT,NETHERLANDS

[2] PHILIPS RES LABS,5600 JA EINDHOVEN,NETHERLANDS

[3] PHILIPS RES LABS,REDHILL RH1 5HA,SURREY,ENGLAND

来源：

PHYSICAL REVIEW LETTERS | 1991年 / 66卷 / 16期

关键词：

D O I：

10.1103/PhysRevLett.66.2148

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The kinetics of charge transport in quantum point contacts has been studied by low-frequency noise spectroscopy. Temperature and frequency (Lorentzian and 1/f) dependences of the noise spectral density are found to vary strongly from device to device, but the low-T conductance dependence universally exhibits a strong quantum size effect. Based on the direct observation in the time domain of spontaneous resistance switching, the noise is identified to be due to trapping processes which affect the local electrostatic potential. A model is presented which explains the main experimental observations.

引用

页码：2148 / 2151

页数：4

共 14 条

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