ELLIPSOMETRIC EXAMINATION OF THE THERMAL-OXIDATION PROCESS FOR PLATED CHROMIUM FILMS

被引：21

作者：

IDCZAK, E

OLESZKIEWICZ, E

机构：

来源：

关键词：

D O I：

10.1016/0040-6090(81)90321-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：301 / 303

页数：3

共 9 条

[1] GORSHKOV MM, 1974, ELIPSOMETRYA
[2] ELLIPSOMETRIC EXAMINATION OF ION-PLATED CHROMIUM FILMS IN THE VISIBLE SPECTRAL RANGE
IDCZAK, E
OLESZKIEWICZ, E
TANCULA, M
[J]. THIN SOLID FILMS, 1980, 72 (03) : L21 - L23
[3] IDCZAK E, 1979, OPT APPL, V9, P47
[4] IDCZAK E, 1976, 249 TU WROCL I PHYS
[5] KUBASCHEWSKI O, 1949, J I MET, V75, P403
[6] Matsunaga Y., 1933, JAPAN NICKEL REV, V1, P347
[7] MENDRELA E, 1978, 13 TU WROCL REP S, P109
[8] HIGH TEMPERATURE SCALING OF COBALT-CHROMIUM ALLOYS
PHALNIKAR, CA
EVANS, EB
BALDWIN, WM
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1956, 103 (08) : 429 - 438
[9] A THEORETICAL AND EXPERIMENTAL ANALYSIS OF ELLIPSOMETER
SMITH, PH
[J]. SURFACE SCIENCE, 1969, 16 : 34 - &