INSOLUBILIZATION MECHANISM OF CHEMICALLY AMPLIFIED NEGATIVE PHOTORESISTS

被引:8
作者
YAMAGUCHI, A
KISHIMURA, S
TSUJITA, K
MORIMOTO, H
TSUKAMOTO, K
NAGATA, H
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1993年 / 11卷 / 06期
关键词
D O I
10.1116/1.586617
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article reports on the difference of chemical reactions of polyvinylphenol (PVP) and novolak resin as a base polymer with a melamine cross-linker. Measurements by gel permeation chromatography (GPC) and solubility testing using alkaline developer and acetone indicate that a cross-linking reaction is predominant for dissolution inhibition in the case of the resists comprising PVP (PVP-type resists), while protection of hydroxyl groups for the developer is predominant in the case of the resists comprising novolak resin (novolak-type resists). The dissolution characteristics show that the novolak-type resists have higher contrast than the PVP-type resists. As the concentration of the melamine cross-linker increases, the resolution of the PVP-type resist becomes higher, while that of the novolak-type resist becomes lower. Significant differences in chemical reactions and lithographic performances were found between PVP and novolak resin for chemically amplified negative photoresists.
引用
收藏
页码:2867 / 2871
页数:5
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