ULTRATHIN AU FILMS STUDIED WITH THE SCANNING TUNNELING MICROSCOPE - TOPOGRAPHY OF INSULATING SURFACES

被引：8

作者：

JAKLEVIC, RC ^{[1
]}

ELIE, L ^{[1
]}

SHEN, W ^{[1
]}

CHEN, JT ^{[1
]}

机构：

[1] WAYNE STATE UNIV,DEPT PHYS,DETROIT,MI 48202

来源：

APPLIED PHYSICS LETTERS | 1988年 / 52卷 / 20期

关键词：

D O I：

10.1063/1.99048

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1656 / 1657

页数：2

共 11 条

[1]

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[2] SCANNING TUNNELING MICROSCOPY [J].

BINNIG, G ;

ROHRER, H .

SURFACE SCIENCE, 1983, 126 (1-3) :236-244

[3]

GARCIA N, 1987, 1ST P INT C SCANN TU

[4]

GARCIA N, 1986, IBM J RES DEV, V30, P353

[5] SILVER FILMS CONDENSED AT 300-K AND 90-K - SCANNING TUNNELING MICROSCOPY OF THEIR SURFACE-TOPOGRAPHY [J].

GIMZEWSKI, JK ;

HUMBERT, A ;

BEDNORZ, JG ;

REIHL, B .

PHYSICAL REVIEW LETTERS, 1985, 55 (09) :951-954

[6] EXPERIMENTAL STUDY OF QUANTUM SIZE EFFECTS IN THIN METAL-FILMS BY ELECTRON TUNNELING [J].

JAKLEVIC, RC ;

LAMBE, J .

PHYSICAL REVIEW B, 1975, 12 (10) :4146-4160

[7] APPLICATION OF THE SCANNING TUNNELING MICROSCOPE TO INSULATING SURFACES [J].

JAKLEVIC, RC ;

ELIE, L ;

SHEN, W ;

CHEN, JT .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :448-453

[8]

KAISER WJ, 1987, SURF SCI, V182, pL227

[9]

KAISER WJ, IN PRESS REV SCI INS

[10] TECHNOLOGICAL APPLICATIONS OF SCANNING TUNNELING MICROSCOPY AT ATMOSPHERIC-PRESSURE [J].

MIRANDA, R ;

GARCIA, N ;

BARO, AM ;

GARCIA, R ;

PENA, JL ;

ROHRER, H .

APPLIED PHYSICS LETTERS, 1985, 47 (04) :367-369

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