HIGH-RESOLUTION DARK-FIELD ELECTRON-MICROSCOPY .1. USEFUL APPROXIMATIONS

被引：43

作者：

COWLEY, JM ^{[1
]}

机构：

[1] ARIZONA STATE UNIV, DEPT PHYS, TEMPE, AZ 85281 USA

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1973年 / A 29卷 / SEP1期

关键词：

D O I：

10.1107/S0567739473001324

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：529 / 536

页数：8

共 18 条

[1] NBEAM LATTICE IMAGES .3. UPPER LIMITS OF IONICITY IN W4NB26O77 [J].

ANSTIS, GR ;

LYNCH, DF ;

MOODIE, AF ;

OKEEFE, MA .

ACTA CRYSTALLOGRAPHICA SECTION A, 1973, A 29 (MAR1) :138-&

[2] ELECTRON-MICROSCOPE IMAGE CONTRAST FOR THIN CRYSTALS [J].

COWLEY, JM ;

IIJMA, S .

ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1972, A 27 (03) :445-+

[3] FOURIER IMAGES .4. THE PHASE GRATING [J].

COWLEY, JM ;

MOODIE, AF .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1960, 76 (489) :378-&

[4] IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE [J].

COWLEY, JM .

APPLIED PHYSICS LETTERS, 1969, 15 (02) :58-&

[5]

Crewe A. V., 1970, Optik, V30, P461

[6]

DUPUOY G, 1970, J MICROSC-OXFORD, V9, P575

[7] IMAGING OF SINGLE ATOMS WITH ELECTRON MICROSCOPE BY PHASE CONTRAST [J].

EISENHANDLER, CB ;

SIEGEL, BM .

JOURNAL OF APPLIED PHYSICS, 1966, 37 (04) :1613-+

[8] MEASUREMENT AND COMPENSATION OF DEFOCUSING AND ABERRATIONS BY FOURIER PROCESSING OF ELECTRON MICROGRAPHS [J].

ERICKSON, HP ;

KLUG, A .

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY OF LONDON SERIES B-BIOLOGICAL SCIENCES, 1971, 261 (837) :105-&

[9]

FEJES PL, 1972, 30 P ANN M EMSA, P558

[10] VISUALISATION OF SINGLE HEAVY ATOMS WITH ELECTRON MICROSCOPE [J].

FORMANEK, H ;

MULLER, M ;

HAHN, MH ;

KOLLER, T .

NATURWISSENSCHAFTEN, 1971, 58 (07) :339-&

← 1 2 →