ATOMIC FORCE MICROSCOPY OF EXTENDED-CHAIN CRYSTALS OF POLYETHYLENE

被引：24

作者：

ANNIS, BK ^{[1
]}

REFFNER, JR ^{[1
]}

WUNDERLICH, B ^{[1
]}

机构：

[1] UNIV TENNESSEE,DEPT CHEM,KNOXVILLE,TN 37996

来源：

JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS | 1993年 / 31卷 / 01期

关键词：

ATOMIC FORCE MICROSCOPY OF EXTENDED CHAIN POLYETHYLENE CRYSTALS; POLYETHYLENE IN EXTENDED CHAIN CRYSTALS; ATOMIC FORCE MICROSCOPY OF;

D O I：

10.1002/polb.1993.090310112

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

Extended-chain crystals of polyethylene grown at elevated pressure and temperature were analyzed for the first time by atomic force microscopy. It was possible to compare the typical fracture surface striation features with those obtained earlier by electron microscopy. High resolution atomic force microscopy on flat surfaces enabled the recording of an atomic scale regularity that could not be fully identified.

引用

页码：93 / 97

页数：5