MICROSTRUCTURE OF LASER-DEPOSITED SUPERCONDUCTING ND1.85CE0.15CUO4-Y FILMS

被引：18

作者：

BEESABATHINA, DP

SALAMANCARIBA, L

MAO, SN

XI, XX

VENKATESAN, T

机构：

[1] UNIV MARYLAND,DEPT PHYS,CTR SUPERCONDUCT RES,COLL PK,MD 20742

[2] UNIV MARYLAND,DEPT ELECT ENGN,COLL PK,MD 20742

来源：

APPLIED PHYSICS LETTERS | 1993年 / 62卷 / 23期

关键词：

D O I：

10.1063/1.109177

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The morphology and microstructure of Nd1.85Ce0.15CuO4-y (NCCO) films grown epitaxially on (100) LaAlO3 (LAO) by pulsed laser deposition were studied by selected-area electron diffraction and high-resolution electron microscopy. The films were composed primarily of c-axis oriented grains and did not contain any polytypoidic faulting. The in-plane epitaxial relationship of the films was found to be [100]NCCO //[001]LAO. The Nd1.85Ce0.15CUO4-y-LaAlO3 interface is sharp and free of defects. A weak peak around the (110) position of NCCO(T') structure in x-ray diffraction was observed. Using microdiffraction and energy-dispersive x-ray analysis, we confirmed that this peak corresponds to the (004) reflection of cubic Ce0.5Nd0.5O1.75.

引用

页码：3022 / 3024

页数：3