REAL-TIME OBSERVATION OF THE INTERACTION BETWEEN FLUX LINES AND DEFECTS IN A SUPERCONDUCTOR BY LORENTZ MICROSCOPY

被引：24

作者：

HARADA, K

KASAI, H

MATSUDA, T

YAMASAKI, M

BONEVICH, JE

TONOMURA, A

机构：

[1] Advanced Research Laboratory, Hitachi Ltd., Hatoyama, Saitama

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1994年 / 33卷 / 5A期

关键词：

SUPERCONDUCTOR; SUPERCONDUCTIVE FLUX LINE; FLUX-LINE DYNAMICS; PINNING SITE; ELECTRON MICROSCOPY; LORENTZ MICROSCOPY; REAL-TIME OBSERVATION; LOW-TEMPERATURE SPECIMEN STAGE; FIELD EMISSION ELECTRON MICROSCOPE;

D O I：

10.1143/JJAP.33.2534

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Flux tines in a Nb thin film at 4.5 K were observed by using a 300-kV field-emission transmission electron microscope equipped with a TV system. When the magnetic field applied to the film was suddenly changed, flux lines moved until arriving at an equilibrium state by hopping from one pinning center to another. Frame-by-frame observation of videotape recorded with a time resolution of 1/30 s revealed how individual flux lines behaved when they came across subgrain boundaries, and interacted with the boundaries.

引用

收藏

页码：2534 / 2540

页数：7

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