SCANNING HALL PROBE MICROSCOPY

被引：317

作者：

CHANG, AM ^{[1
]}

HALLEN, HD ^{[1
]}

HARRIOTT, L ^{[1
]}

HESS, HF ^{[1
]}

KAO, HL ^{[1
]}

KWO, J ^{[1
]}

MILLER, RE ^{[1
]}

WOLFE, R ^{[1
]}

VANDERZIEL, J ^{[1
]}

CHANG, TY ^{[1
]}

机构：

[1] AT&T BELL LABS,HOLMDEL,NJ 07733

来源：

APPLIED PHYSICS LETTERS | 1992年 / 61卷 / 16期

关键词：

D O I：

10.1063/1.108334

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We describe the implementation of a scanning Hall probe microscope of outstanding magnetic field sensitivity (approximately 0.1 G) and unprecedented spatial resolution (approximately 0.35 mum) to detect surface magnetic fields at close proximity to a sample. Our microscope combines the advantages of a submicron Hall probe fabricated on a GaAs/Al0.3Ga0.7As heterostructure chip and the scanning tunneling microscopy technique for precise positioning. We demonstrate its usefulness by imaging individual vortices in high T(c) La1.85Sr0.15CuO4 films and superconducting networks, and magnetic bubble domains.

引用

页码：1974 / 1976

页数：3

共 16 条

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