ORIGIN OF RESIDUAL SEMICONDUCTOR-LASER LINEWIDTH IN HIGH-POWER LIMIT

被引:14
作者
KIKUCHI, K
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D O I
10.1049/el:19880681
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码:1001 / 1002
页数:2
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共 5 条
[1]   THEORY OF THE LINEWIDTH OF SEMICONDUCTOR-LASERS [J].
HENRY, CH .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1982, 18 (02) :259-264
[2]   ESTIMATION OF LINEWIDTH ENHANCEMENT FACTOR OF ALGAAS LASERS BY CORRELATION-MEASUREMENT BETWEEN FM AND AM NOISES [J].
KIKUCHI, K ;
OKOSHI, T .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1985, 21 (06) :669-673
[3]   IMPACT OF 1/F-TYPE FM NOISE ON COHERENT OPTICAL COMMUNICATIONS [J].
KIKUCHI, K .
ELECTRONICS LETTERS, 1987, 23 (17) :885-887
[4]  
KOBAYASHI K, 1987, JAN OFC IOOC 87 REN
[5]   NOVEL METHOD FOR HIGH-RESOLUTION MEASUREMENT OF LASER OUTPUT SPECTRUM [J].
OKOSHI, T ;
KIKUCHI, K ;
NAKAYAMA, A .
ELECTRONICS LETTERS, 1980, 16 (16) :630-631