HGCDTE MOLECULAR-BEAM EPITAXY TECHNOLOGY - A FOCUS ON MATERIAL PROPERTIES

被引:10
作者
WU, OK [1 ]
JAMBA, DM [1 ]
KAMATH, GS [1 ]
CHAPMAN, GR [1 ]
JOHNSON, SM [1 ]
PETERSON, JM [1 ]
KOSAI, K [1 ]
COCKRUM, CA [1 ]
机构
[1] SANTA BARBARA RES CTR,GOLETA,CA 93117
关键词
HGCDTE; INFRARED DETECTORS; MOLECULAR BEAM EPITAXY (MBE);
D O I
10.1007/BF02657943
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
HgCdTe MBE technology is becoming a mature growth technology for flexible manufacturing of short-wave, medium-wave, long-wave, and very long-wave infrared focal plane arrays. The main reason that this technology is getting more mature for device applications is the progress made in controlling the dopants (both n-type and p-type in-situ) and the success in lowering the defect density to less than 2 x 10(5)/cm(2) in the base layer. In this paper, we will discuss the unique approach that we have developed for growing As-doped HgCdTe alloys with cadmium arsenide compound. Material properties including composition, crystallinity, dopant activation, minority carrier Lifetime, and morphology are also discussed. In addition, we have fabricated several infrared focal plane arrays using device quality double layers and the device results are approaching that of the state-of-the-art liquid phase epitaxy technology.
引用
收藏
页码:423 / 429
页数:7
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