OVERVIEW OF COMPOSITIONAL MEASUREMENT TECHNIQUES FOR HGCDTE WITH EMPHASIS ON IR TRANSMISSION, ENERGY-DISPERSIVE X-RAY-ANALYSIS AND OPTICAL REFLECTANCE

被引：47

作者：

PRICE, SL ^{[1
]}

BOYD, PR ^{[1
]}

机构：

[1] AMSEL RD NV IRT,NIGHT VIS & ELECTROOPT DIRECTORATE,FT BELVOIR,VA 22060

来源：

SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 1993年 / 8卷 / 06期

关键词：

D O I：

10.1088/0268-1242/8/6S/006

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Three techniques for determining the composition (x = mole fraction of CdTe) of Hg1-xCdxTe are reviewed. These three techniques are infrared transmission (often called FTIR, for Fourier transform infrared) spectroscopy, energy dispersive x-ray analysis (EDX) and optical reflectance (OR). A brief summary of several methods for determining composition in Hg1-xCdxTe is included.

引用

页码：842 / 859

页数：18

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