SPECTRAL RESPONSE SELF-CALIBRATION AND INTERPOLATION OF SILICON PHOTO-DIODES

被引：122

作者：

GEIST, J

ZALEWSKI, EF

SCHAEFER, AR

机构：

来源：

APPLIED OPTICS | 1980年 / 19卷 / 22期

关键词：

D O I：

10.1364/AO.19.003795

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：3795 / 3799

页数：5

共 9 条

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[8] REFLECTANCE OF THINLY OXIDIZED SILICON AT NORMAL INCIDENCE [J].

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[9] SILICON PHOTO-DIODE ABSOLUTE SPECTRAL RESPONSE SELF-CALIBRATION [J].

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APPLIED OPTICS, 1980, 19 (08) :1214-1216

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