SURFACE-ANALYSIS OF ORGANIC MATERIAL WITH TOF-SIMS

被引：29

作者：

HERCULES, DM

机构：

[1] Department of Chemistry, University of Pittsburgh, Pittsburgh

来源：

JOURNAL OF MOLECULAR STRUCTURE | 1993年 / 292卷

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0022-2860(93)80089-E

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The application of TOF-SIMS to the study of organic materials, primarily polymers, is reviewed. A description of instrumentation is given along with the types of ions formed in the SIMS process. Metastable ions are formed in reasonable abundance for flouropolymers. The fragmentation mechanisms for large polymers are discussed with particular emphasis on their importance for interpretation of polymer derived spectra. Two other major topics covered are quantitative analysis and use of derivatizing reagents.

引用

页码：49 / 63

页数：15

共 53 条

[1]

[Anonymous], MACROMOLECULES

[2]

BALLISTERI A, 1988, MACROMOLECULES, V21, P1594

[3] IDENTIFICATION OF THE IONS PRODUCED BY FAST-ATOM-BOMBARDMENT MASS-SPECTROMETRY IN SOME POLYESTERS AND POLYAMIDES [J].