REFLECTANCE-DIFFERENCE SPECTROSCOPY SYSTEM FOR REAL-TIME MEASUREMENTS OF CRYSTAL-GROWTH

被引：79

作者：

ASPNES, DE

HARBISON, JP

STUDNA, AA

FLOREZ, LT

机构：

来源：

APPLIED PHYSICS LETTERS | 1988年 / 52卷 / 12期

关键词：

D O I：

10.1063/1.99240

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：957 / 959

页数：3

共 12 条

[1] ANISOTROPIES IN THE ABOVE BAND-GAP OPTICAL-SPECTRA OF CUBIC SEMICONDUCTORS [J].

ASPNES, DE ;

STUDNA, AA .

PHYSICAL REVIEW LETTERS, 1985, 54 (17) :1956-1959

[2] OPTICAL-REFLECTANCE AND ELECTRON-DIFFRACTION STUDIES OF MOLECULAR-BEAM-EPITAXY GROWTH TRANSIENTS ON GAAS(001) [J].

ASPNES, DE ;

HARBISON, JP ;

STUDNA, AA ;

FLOREZ, LT .

PHYSICAL REVIEW LETTERS, 1987, 59 (15) :1687-1690

[3] ABOVE-BANDGAP OPTICAL ANISOTROPIES IN CUBIC SEMICONDUCTORS - A VISIBLE NEAR ULTRAVIOLET PROBE OF SURFACES [J].

ASPNES, DE .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (05) :1498-1506

[4]

ASPNES DE, 1987, MATER RES SOC S P, V91, P57

[5] PERPENDICULAR-INCIDENCE PHOTOMETRIC ELLIPSOMETRY (PIPE) OF SURFACES WITH ARBITRARY ANISOTROPY [J].

AZZAM, RMA .

JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE, 1981, 12 (05) :317-321

[6]

AZZAM RMA, 1980, OPT ENG, V20, P58

[7] INFRARED REFLECTION ABSORPTION-SPECTROSCOPY OF SURFACE SPECIES - A COMPARISON OF FOURIER-TRANSFORM AND DISPERSION METHODS [J].

GOLDEN, WG ;

SAPERSTEIN, DD ;

SEVERSON, MW ;

OVEREND, J .

JOURNAL OF PHYSICAL CHEMISTRY, 1984, 88 (03) :574-580

[8]

HARBISON JP, IN PRESS J VAC SCI B

[9] REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION INTENSITY BEHAVIOR DURING HOMOEPITAXIAL MOLECULAR-BEAM EPITAXY GROWTH OF GAAS AND IMPLICATIONS FOR GROWTH-KINETICS AND MECHANISMS [J].

LEWIS, BF ;

GRUNTHANER, FJ ;

MADHUKAR, A ;

LEE, TC ;

FERNANDEZ, R .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (05) :1317-1322

[10] THEORY OF HIGH-FREQUENCY DIFFERENTIAL INTERFEROMETRY - APPLICATION TO THE MEASUREMENT OF INFRARED CIRCULAR AND LINEAR DICHROISM VIA FOURIER-TRANSFORM SPECTROSCOPY [J].

NAFIE, LA ;

DIEM, M .

APPLIED SPECTROSCOPY, 1979, 33 (02) :130-135

← 1 2 →