RECENT DEVELOPMENTS IN ANALYTICAL ELECTRON-MICROSCOPY

被引:34
作者
CHANDLER, JA [1 ]
机构
[1] TENOVUS INST CANC RES,CARDIFF CF4 4XX,WALES
来源
JOURNAL OF MICROSCOPY-OXFORD | 1973年 / 98卷 / AUG期
关键词
D O I
10.1111/j.1365-2818.1973.tb03840.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:359 / 378
页数:20
相关论文
共 19 条
  • [1] APPLETON TC, 1972, MICRON, V3, P101
  • [2] BAHR GF, 1965, LAB INVEST, V14, P377
  • [3] BOROM MP, 1966, 66C484 GEN EL TECHN
  • [4] CHANDLER JA, 1971, AM LAB, V3, P50
  • [5] CHANDLER JW, IN PRESS
  • [6] COOKE CJ, 1968, 5 INT C XRAY OPT MIC, P245
  • [7] THE X-RAY SCANNING MICROANALYSER
    DUNCUMB, P
    [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1959, 10 (09): : 420 - 427
  • [8] A MONTE CARLO CALCULATION OF SPATIAL DISTRIBUTION OF CHARACTERISTIC X-RAY PRODUCTION IN A SOLID TARGET
    GREEN, M
    [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1963, 82 (526): : 204 - +
  • [9] HALL TA, 1971, PHYSICAL TECHNIQUE A, V1
  • [10] HENDERSON W J, 1969, Journal of Microscopy (Oxford), V89, P369