THE X-RAY SCANNING MICROANALYSER

[1] ELECTRON PROBE X-RAY MICROANALYZER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1957, 28 (09) : 709 - 712

[2] BOROVSKII IB, 1953, PROBLEMY METALLURGII, P135

[3] BRAXTON WL, 1945, PHYS REV, V68, P106

[4] SUR LES BASES PHYSIQUES DE LANALYSE PONCTUELLE PAR SPECTROGRAPHIE-X [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1955, 16 (04): : 304 - 317

[5] CASTAING R, 1951, PARIS U ONERA PUBL, V55

[6] CASTAING R, 1949, P C ELECTRON MICROSC

[7] CASTAING R, 1958, RECHERCHE AERONAUTIQ, V3, P41

[8] COMPTON AH, 1935, XRAYS THEORY EXPT, P76

[9] MICRO-ANALYSIS BY A FLYING-SPOT X-RAY METHOD [J]. NATURE, 1956, 177 (4521) : 1172 - 1173

[10] THE X-RAY SHADOW MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (05) : 616 - 623

[1] ELECTRON PROBE X-RAY MICROANALYZER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1957, 28 (09) : 709 - 712

[2] BOROVSKII IB, 1953, PROBLEMY METALLURGII, P135

[3] BRAXTON WL, 1945, PHYS REV, V68, P106

[4] SUR LES BASES PHYSIQUES DE LANALYSE PONCTUELLE PAR SPECTROGRAPHIE-X [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1955, 16 (04): : 304 - 317

[5] CASTAING R, 1951, PARIS U ONERA PUBL, V55

[6] CASTAING R, 1949, P C ELECTRON MICROSC

[7] CASTAING R, 1958, RECHERCHE AERONAUTIQ, V3, P41

[8] COMPTON AH, 1935, XRAYS THEORY EXPT, P76

[9] MICRO-ANALYSIS BY A FLYING-SPOT X-RAY METHOD [J]. NATURE, 1956, 177 (4521) : 1172 - 1173

[10] THE X-RAY SHADOW MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (05) : 616 - 623